New statistical randomness tests: 4-bit template matching tests

Fatih SULAK

Makale detayları

New statistical randomness tests: 4-bit template matching tests

Yazarlar:

Fatih SULAK

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Mathematics 2017 Vol.41 Issue 1, pp.80-95

Belge Tipi:

Makale

Yayın Tarihi:

1/2017

Belge Dili:

Türkçe

Document ID (Org No.):

2000746088

Sıklık:

İki Aylık

eISSN:

1303-6149

pISSN:

1300-0098

Özet:

 

For cryptographic algorithms, secret keys should be generated randomly as the security of the system depends on the key and therefore generation of random sequences is vital. Randomness testing is done by means of statistical randomness tests. In this work, we show that the probabilities for the overlapping template matching test in the NIST test suite are only valid for a specific template and need to be recalculated for the other templates. We calculate the exact distribution for all 4-bit templates and propose new randomness tests, namely template matching tests. The new tests can be applied to any sequence of minimum length 5504 whereas the overlapping template matching test in the NIST test suite can only be applied to sequences of minimum length 10610610^6. Moreover, we apply the proposed tests to biased nonrandom data and observe that the new tests detect the nonrandom behavior of the generator even for a bias of 0.0010.0010.001, whereas the template matching tests in NIST cannot detect that bias.

Makale detayları

New statistical randomness tests: 4-bit template matching tests

Yazarlar: Fatih SULAK

Yayıncı: TUBITAK

Dergi: Turkish Journal of Mathematics 2017 Vol.41 Issue 1, pp.80-95

Belge Tipi: Makale

Yayın Tarihi: 1/2017

Belge Dili: Türkçe

Document ID (Org No.): 2000746088

Sıklık: İki Aylık

eISSN: 1303-6149

pISSN: 1300-0098

Sayı

Yazarlar:

Fatih SULAK

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Mathematics 2017 Vol.41 Issue 1, pp.80-95

Belge Tipi:

Makale

Yayın Tarihi:

1/2017

Belge Dili:

Türkçe

Document ID (Org No.):

2000746088

Sıklık:

İki Aylık

eISSN:

1303-6149

pISSN:

1300-0098