PIXE, Particel Induced X-Ray Emission A Concise Review

A. İnhan GARİP

Makale detayları

PIXE, Particel Induced X-Ray Emission A Concise Review

Yazarlar:

A. İnhan GARİP

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Chemistry 1998 Vol.22 Issue 3, pp.183-200

Belge Tipi:

Makale

Yayın Tarihi:

2/1998

Belge Dili:

Türkçe

Document ID (Org No.):

2000730567

Sıklık:

İki Aylık

eISSN:

1303-6130

pISSN:

1300-0527

Özet:

 

PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.

 

PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.

Makale detayları

PIXE, Particel Induced X-Ray Emission A Concise Review

Yazarlar: A. İnhan GARİP

Yayıncı: TUBITAK

Dergi: Turkish Journal of Chemistry 1998 Vol.22 Issue 3, pp.183-200

Belge Tipi: Makale

Yayın Tarihi: 2/1998

Belge Dili: Türkçe

Document ID (Org No.): 2000730567

Sıklık: İki Aylık

eISSN: 1303-6130

pISSN: 1300-0527

Sayı

Yazarlar:

A. İnhan GARİP

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Chemistry 1998 Vol.22 Issue 3, pp.183-200

Belge Tipi:

Makale

Yayın Tarihi:

2/1998

Belge Dili:

Türkçe

Document ID (Org No.):

2000730567

Sıklık:

İki Aylık

eISSN:

1303-6130

pISSN:

1300-0527