Identifying Alternative Techniques for the Characterization of Glass Defects

Pelin Akkaya; Yusuf Kagan Kadıoğlu

Makale detayları

Identifying Alternative Techniques for the Characterization of Glass Defects

Yazarlar:

Pelin Akkaya | Yusuf Kagan Kadıoğlu

Yayıncı:

Osmaniye Korkut Ata Üniversitesi

Ana Başlıklar:

Mineraloji-Petrografi

Dergi:

Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi Vol.7 Issue 1, pp.294-309

Belge Tipi:

Makale

Yayın Tarihi:

1/2024

Belge Dili:

Türkçe

Document ID (Org No.):

2001310155

pISSN:

2687-3729

Anahtar kelimeler:

Özet:

 The characterization of defects in glass production is the most crucial factor affecting the glass production process. Accurate and fast characterization is important in terms of detecting the source of defects and preventing the formation of defects. Whether the glass defects are gas, amorphous knotcord, or crystalline stone is important for determining the technique to be applied in finding the source of the defect. Different analysis techniques have been applied to determine the properties of various solid stone glass defects. In this study, which aims to characterize and define the solid glass defects stone affecting the glass quality and to determine the source of the defect correctly; glass defects were examined by Micro X-ray Diffraction, Micro Raman Spectroscopy, and Fourier Transform Infrared Spectrometry methods as an alternative to the currently used Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy methods. The characterization of glass defects by Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method is performed together with microstructure examination and semi-quantitative chemical analysis. With Micro X-ray Diffraction, the defect is qualitatively identified by phase detection. Micro Raman Spectroscopy and Fourier Transform Infrared Spectrometer give results according to the molecular bond characterization of the crystalline inclusions stone defects. In this study, different types of defects were examined with these methods, then these four methods were compared, and their applicability was evaluated. As a result of the study, these four methods were compared, and their applicability was evaluated. Interpretation of the results is very important since the four methods examined are analysis techniques based on different foundations. While microstructural examination and semi-quantitative results are assessed in Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method, it is possible to get an idea about the formation temperatures of solid glass defects since qualitative determination can be made by phase determination from the analyses made by Micro X-ray Diffraction method. It has been observed that the defect should be homogeneous while obtaining qualitative results in Micro Raman analysis. Although qualitative results are obtained with the spectrum obtained in Fourier Transform Infrared Spectrometer analysis, a detailed literature search is required for the interpretation of the data. Although the most appropriate method for defect determination varies depending on the defect type and crystal structure, it will be µXRD, which supports the findings obtained by stereo microscope and SEM-EDS with phase determination. The importance of phase determination is that it provides the opportunity to make predictions about the source of the error, as it can be commented on the crystal formation temperature.

 The characterization of defects in glass production is the most crucial factor affecting the glass production process. Accurate and fast characterization is important in terms of detecting the source of defects and preventing the formation of defects. Whether the glass defects are gas, amorphous knotcord, or crystalline stone is important for determining the technique to be applied in finding the source of the defect. Different analysis techniques have been applied to determine the properties of various solid stone glass defects. In this study, which aims to characterize and define the solid glass defects stone affecting the glass quality and to determine the source of the defect correctly; glass defects were examined by Micro X-ray Diffraction, Micro Raman Spectroscopy, and Fourier Transform Infrared Spectrometry methods as an alternative to the currently used Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy methods. The characterization of glass defects by Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method is performed together with microstructure examination and semi-quantitative chemical analysis. With Micro X-ray Diffraction, the defect is qualitatively identified by phase detection. Micro Raman Spectroscopy and Fourier Transform Infrared Spectrometer give results according to the molecular bond characterization of the crystalline inclusions stone defects. In this study, different types of defects were examined with these methods, then these four methods were compared, and their applicability was evaluated. As a result of the study, these four methods were compared, and their applicability was evaluated. Interpretation of the results is very important since the four methods examined are analysis techniques based on different foundations. While microstructural examination and semi-quantitative results are assessed in Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method, it is possible to get an idea about the formation temperatures of solid glass defects since qualitative determination can be made by phase determination from the analyses made by Micro X-ray Diffraction method. It has been observed that the defect should be homogeneous while obtaining qualitative results in Micro Raman analysis. Although qualitative results are obtained with the spectrum obtained in Fourier Transform Infrared Spectrometer analysis, a detailed literature search is required for the interpretation of the data. Although the most appropriate method for defect determination varies depending on the defect type and crystal structure, it will be µXRD, which supports the findings obtained by stereo microscope and SEM-EDS with phase determination. The importance of phase determination is that it provides the opportunity to make predictions about the source of the error, as it can be commented on the crystal formation temperature.

 The characterization of defects in glass production is the most crucial factor affecting the glass production process. Accurate and fast characterization is important in terms of detecting the source of defects and preventing the formation of defects. Whether the glass defects are gas, amorphous knotcord, or crystalline stone is important for determining the technique to be applied in finding the source of the defect. Different analysis techniques have been applied to determine the properties of various solid stone glass defects. In this study, which aims to characterize and define the solid glass defects stone affecting the glass quality and to determine the source of the defect correctly; glass defects were examined by Micro X-ray Diffraction, Micro Raman Spectroscopy, and Fourier Transform Infrared Spectrometry methods as an alternative to the currently used Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy methods. The characterization of glass defects by Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method is performed together with microstructure examination and semi-quantitative chemical analysis. With Micro X-ray Diffraction, the defect is qualitatively identified by phase detection. Micro Raman Spectroscopy and Fourier Transform Infrared Spectrometer give results according to the molecular bond characterization of the crystalline inclusions stone defects. In this study, different types of defects were examined with these methods, then these four methods were compared, and their applicability was evaluated. As a result of the study, these four methods were compared, and their applicability was evaluated. Interpretation of the results is very important since the four methods examined are analysis techniques based on different foundations. While microstructural examination and semi-quantitative results are assessed in Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method, it is possible to get an idea about the formation temperatures of solid glass defects since qualitative determination can be made by phase determination from the analyses made by Micro X-ray Diffraction method. It has been observed that the defect should be homogeneous while obtaining qualitative results in Micro Raman analysis. Although qualitative results are obtained with the spectrum obtained in Fourier Transform Infrared Spectrometer analysis, a detailed literature search is required for the interpretation of the data. Although the most appropriate method for defect determination varies depending on the defect type and crystal structure, it will be µXRD, which supports the findings obtained by stereo microscope and SEM-EDS with phase determination. The importance of phase determination is that it provides the opportunity to make predictions about the source of the error, as it can be commented on the crystal formation temperature.

 Cam üretiminde ortaya çıkan hataların karakterizasyonu, cam üretim sürecini etkileyen en önemli faktördür. Doğru ve hızlı karakterizasyon, hata kaynağının tespiti ve hataların oluşumunun engellenmesi bakımından önem teşkil etmektedir. Cam hatalarının katı ya da gaz, amorf düğmedamar ya da kristalin taş olması hatanın kaynağını bulmakta uygulanacak tekniğin belirlenmesi için önemlidir. Farklı katı cam hatalarının özelliklerinin belirlenmesinde farklı analiz teknikleri uygulanmıştır. Cam kalitesini etkileyen katı cam hatalarının taş karakterize edilerek tanımlanmasını ve hata kaynağının doğru tespit edilmesini amaçlayan bu çalışmada; cam hataları mevcutta kullanılmakta olan Taramalı Elektron Mikroskobu ve Enerji Dağılımlı X-ışını Spektroskopisi yöntemine alternatif olarak Mikro X-ışını Kırınımı, Mikro Raman Spektroskopisi ve Fourier Dönüşümlü Kızılötesi Spektrometresi yöntemleri ile incelenmiştir. Taramalı Elektron Mikroskobu ve Enerji Dağılımlı X-ışını Spektroskopisi yöntemiyle cam hatalarının karakterizasyonu, mikroyapı incelemesi ve yarı kantitatif kimyasal analizi ile birlikte yapılmaktadır. Mikro X-ışını Kırınımı ile hata, faz tespiti ile kalitatif bir şekilde tanımlanmaktadır. Mikro Raman Spektroskopisi ve Fourier Dönüşümlü Kızılötesi Spektrometresi ise kristalin inklüzyonların taş hatası içerdiği moleküler bağ karakterizasyonuna göre sonuç vermektedir. Çalışmada farklı türde hataların incelemeleri bu metotlarla yapılarak bu dört yöntemin karşılaştırması yapılmış ve bunların uygulanabilirliği değerlendirilmiştir. İncelenen dört yöntemin farklı temellere dayanan analiz tekniği olmasından dolayı çıkan sonuçların yorumlanması oldukça önemlidir. Taramalı Elektron Mikroskobu ve Enerji Dağılımlı X-ışını Spektroskopisi yönteminde mikroyapı incelemesi ve yarı kantitatif sonuçlar değerlendirilirken, Mikro X-ışını Kırınımı yöntemiyle yapılan analizlerden faz tayini ile kalitatif tespit yapılabildiğinden katı cam hatalarının oluşum sıcaklıkları hakkında da fikir elde edilebilmektedir. Mikro Raman analizlerinde de kalitatif sonuçlar alınırken hatanın homojen olması gerektiği görülmüştür. Fourier Dönüşümlü Kızılötesi Spektrometresi analizlerinde alınan spektrum ile kalitatif sonuçlara ulaşılsa da verilerin yorumlanması için detaylı bir literatür araştırması gerekmektedir. Hata tayininde en uygun yöntem hata türüne ve kristal yapısına bağlı değişkenlik göstermekle birlikte, stereo mikroskop ve SEM-EDS ile edinilen bulguları faz tayiniyle destekleyen µXRD olacaktır. Faz tayininin önemi, kristalin oluşum sıcaklığı konusunda yorum yapılabildiğinden hatanın kaynağı konusunda öngörü yapma olanağı sunmasıdır.

Makale detayları

Identifying Alternative Techniques for the Characterization of Glass Defects

Yazarlar:

Pelin Akkaya | Yusuf Kagan Kadıoğlu

Yayıncı:

Osmaniye Korkut Ata Üniversitesi

Ana Başlıklar:

Mineraloji-Petrografi

Dergi:

Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi Vol.7 Issue 1, pp.294-309

Belge Tipi:

Makale

Yayın Tarihi:

1/2024

Belge Dili:

Türkçe

Document ID (Org No.):

2001310155

pISSN:

2687-3729

Glass

Glass defect

microstructure

microanalysis

characterization

spectroscopic analysisCam

Cam hatası

Mikroyapı

Mikroanaliz

Karakterizasyon

Spektroskopik analiz

Sayı

Makale detayları

Yazarlar: Pelin Akkaya | Yusuf Kagan Kadıoğlu

Yayıncı: Osmaniye Korkut Ata Üniversitesi

Ana Başlıklar: Mineraloji-Petrografi

Dergi: Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi Vol.7 Issue 1, pp.294-309

Belge Tipi: Makale

Yayın Tarihi: 1/2024

Belge Dili: Türkçe

Document ID (Org No.): 2001310155

pISSN: 2687-3729

Sayı

Yazarlar:

Pelin Akkaya | Yusuf Kagan Kadıoğlu

Yayıncı:

Osmaniye Korkut Ata Üniversitesi

Ana Başlıklar:

Mineraloji-Petrografi

Dergi:

Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi Vol.7 Issue 1, pp.294-309

Belge Tipi:

Makale

Yayın Tarihi:

1/2024

Belge Dili:

Türkçe

Document ID (Org No.):

2001310155

pISSN:

2687-3729