Characteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method

Özgür ÖZTÜRK; Elif AŞIKUZUN; Zeynep Banu HACIOĞLU; Serap SAFRAN

doi:https://doi.org/10.2339/politeknik.676184

Makale detayları

Characteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method

Yazarlar:

Özgür ÖZTÜRK | Elif AŞIKUZUN | Zeynep Banu HACIOĞLU | Serap SAFRAN

Yayıncı:

Gazi University

Ana Başlıklar:

Uygulamalı fizik

Dergi:

Journal of Polytechnic 2022 Vol.25 Issue 1, pp.37-45

Belge Tipi:

Makale

Yayın Tarihi:

2/2022

Belge Dili:

İngilizce

Document ID (Org No.):

2000588593

Sıklık:

Aylık

eISSN:

2147-9429

DOI:

https://doi.org/10.2339/politeknik.676184

Özet:

 


In this study, Er doped ZnO based semiconducting nano thin films are produced by the sol-gel technique using dip coating method which is widely used method for preparing nano size materials. 〖Zn〗_(1-x) 〖Er〗_x O thin films are prepared different coating thickness using different solvent. The effect of the Er doping and film thickness on structural, electric and optic properties of the ZnO semiconducting nano thin films are investigated in detail and compared with undoped sample which prepared in same conditions. X-ray diffraction analysis (XRD) has been used to determine phase and lattice parameters of the semiconducting thin films and scanning electron microscope (SEM) measurements are made for microstructure properties. The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.

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In this study, Er doped ZnO based semiconducting nano thin films are produced by the sol-gel technique using dip coating method which is widely used method for preparing nano size materials. 〖Zn〗_(1-x) 〖Er〗_x O thin films are prepared different coating thickness using different solvent. The effect of the Er doping and film thickness on structural, electric and optic properties of the ZnO semiconducting nano thin films are investigated in detail and compared with undoped sample which prepared in same conditions. X-ray diffraction analysis (XRD) has been used to determine phase and lattice parameters of the semiconducting thin films and scanning electron microscope (SEM) measurements are made for microstructure properties. The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.

Makale detayları

Characteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method

Yazarlar: Özgür ÖZTÜRK | Elif AŞIKUZUN | Zeynep Banu HACIOĞLU | Serap SAFRAN

Yayıncı: Gazi University

Ana Başlıklar: Uygulamalı fizik

Dergi: Journal of Polytechnic 2022 Vol.25 Issue 1, pp.37-45

Belge Tipi: Makale

Yayın Tarihi: 2/2022

Belge Dili: İngilizce

Document ID (Org No.): 2000588593

Sıklık: Aylık

eISSN: 2147-9429

DOI: https://doi.org/10.2339/politeknik.676184

Sayı

Yazarlar:

Özgür ÖZTÜRK | Elif AŞIKUZUN | Zeynep Banu HACIOĞLU | Serap SAFRAN

Yayıncı:

Gazi University

Ana Başlıklar:

Uygulamalı fizik

Dergi:

Journal of Polytechnic 2022 Vol.25 Issue 1, pp.37-45

Belge Tipi:

Makale

Yayın Tarihi:

2/2022

Belge Dili:

İngilizce

Document ID (Org No.):

2000588593

Sıklık:

Aylık

eISSN:

2147-9429

DOI:

https://doi.org/10.2339/politeknik.676184