Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films

S. Pamir Alpay And Alexander L. ROYTBURD

Makale detayları

Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films

Yazarlar:

S. Pamir Alpay And Alexander L. ROYTBURD

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Physics 2000 Vol.24 Issue 2, pp.85-92

Belge Tipi:

Makale

Yayın Tarihi:

1/2000

Belge Dili:

Türkçe

Document ID (Org No.):

2000762761

Sıklık:

İki Aylık

eISSN:

1303-6122

pISSN:

1300-0101

Anahtar kelimeler:

Özet:

 

Ferroelectric or ferroelastic epitaxial films undergoing a cubic-to-tetragonal phase transformation usually relax the resultant strain energy due to lattice misfit by forming a polytwin (polydomain) structure. Polydomain formation occurs at the expense of building interdomain interfaces and microstresses which develop at the film-substrate interface due to the periodic deviation of the strain. The interplay between these components results in a critical thickness for domain formation below which the polydomain structure is not stable. In this article, we investigate the film thickness dependence of a polydomain structure using a thermodynamical approach.

 

Ferroelectric or ferroelastic epitaxial films undergoing a cubic-to-tetragonal phase transformation usually relax the resultant strain energy due to lattice misfit by forming a polytwin (polydomain) structure. Polydomain formation occurs at the expense of building interdomain interfaces and microstresses which develop at the film-substrate interface due to the periodic deviation of the strain. The interplay between these components results in a critical thickness for domain formation below which the polydomain structure is not stable. In this article, we investigate the film thickness dependence of a polydomain structure using a thermodynamical approach.

Makale detayları

Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films

Yazarlar:

S. Pamir Alpay And Alexander L. ROYTBURD

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Physics 2000 Vol.24 Issue 2, pp.85-92

Belge Tipi:

Makale

Yayın Tarihi:

1/2000

Belge Dili:

Türkçe

Document ID (Org No.):

2000762761

Sıklık:

İki Aylık

eISSN:

1303-6122

pISSN:

1300-0101

Turk. J. Phys.

24

(2000)

85-92. Full text: pdf Other articles published in the same issue: Turk. J. Phys.

vol.24

iss.2.

Sayı

Makale detayları

Thickness Dependence of c/a Polytwin Structures Observed in Epitaxial Oxide Ferroelectric Thin Films

Yazarlar: S. Pamir Alpay And Alexander L. ROYTBURD

Yayıncı: TUBITAK

Dergi: Turkish Journal of Physics 2000 Vol.24 Issue 2, pp.85-92

Belge Tipi: Makale

Yayın Tarihi: 1/2000

Belge Dili: Türkçe

Document ID (Org No.): 2000762761

Sıklık: İki Aylık

eISSN: 1303-6122

pISSN: 1300-0101

Turk. J. Phys.

24

(2000)

85-92. Full text: pdf Other articles published in the same issue: Turk. J. Phys.

vol.24

iss.2.

Sayı

Yazarlar:

S. Pamir Alpay And Alexander L. ROYTBURD

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Physics 2000 Vol.24 Issue 2, pp.85-92

Belge Tipi:

Makale

Yayın Tarihi:

1/2000

Belge Dili:

Türkçe

Document ID (Org No.):

2000762761

Sıklık:

İki Aylık

eISSN:

1303-6122

pISSN:

1300-0101