Morphological and optical properties of vacuum evaporated ZnO thin films

Farzana CHOWDHURY; S. M. Firoz HASAN and M. Sahabul ALAM

Makale detayları

Morphological and optical properties of vacuum evaporated ZnO thin films

Yazarlar:

Farzana CHOWDHURY | S. M. Firoz HASAN and M. Sahabul ALAM

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Physics 2012 Vol.36 Issue 1, pp.1-7

Belge Tipi:

Makale

Yayın Tarihi:

12/2011

Belge Dili:

Türkçe

Document ID (Org No.):

2000760457

Sıklık:

İki Aylık

eISSN:

1303-6122

pISSN:

1300-0101

Anahtar kelimeler:

Özet:

 

ZnO thin films were deposited onto chemically and  ultrasonically cleaned glass substrates by thermal evaporation in  vacuum (\sim 10-6 mbar).  The thickness of the films was measured  by frequency shift of quartz crystal.  The optical properties of the  films have been ascertained by UV-VIS-NIR spectrophotometry in the  photon wavelength range of 300--2500 nm.  The effect of substrate  temperature on the optical properties of the films has been  investigated, where all film thickness was kept fixed at 100 \pm 10  nm.  The optical transmittance spectra reveal a maximum transmittance  of 88% at room temperature around photon wavelength of 2350 nm.  Band  gap and Urbach energy values of the films were calculated.  The nature  of the optical transition has been direct allowed.  Surface topography  studied by Atomic Force Microscopy (AFM) measurements showed a uniform  film texture.  The extent and nature of transmittance and optimized  band gap of the material assure to utilize it for optoelectronic  applications.

 

ZnO thin films were deposited onto chemically and  ultrasonically cleaned glass substrates by thermal evaporation in  vacuum (\sim 10-6 mbar).  The thickness of the films was measured  by frequency shift of quartz crystal.  The optical properties of the  films have been ascertained by UV-VIS-NIR spectrophotometry in the  photon wavelength range of 300--2500 nm.  The effect of substrate  temperature on the optical properties of the films has been  investigated, where all film thickness was kept fixed at 100 \pm 10  nm.  The optical transmittance spectra reveal a maximum transmittance  of 88% at room temperature around photon wavelength of 2350 nm.  Band  gap and Urbach energy values of the films were calculated.  The nature  of the optical transition has been direct allowed.  Surface topography  studied by Atomic Force Microscopy (AFM) measurements showed a uniform  film texture.  The extent and nature of transmittance and optimized  band gap of the material assure to utilize it for optoelectronic  applications.

Makale detayları

Morphological and optical properties of vacuum evaporated ZnO thin films

Yazarlar:

Farzana CHOWDHURY | S. M. Firoz HASAN and M. Sahabul ALAM

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Physics 2012 Vol.36 Issue 1, pp.1-7

Belge Tipi:

Makale

Yayın Tarihi:

12/2011

Belge Dili:

Türkçe

Document ID (Org No.):

2000760457

Sıklık:

İki Aylık

eISSN:

1303-6122

pISSN:

1300-0101

ZnO thin film

vacuum evaporation

optical properties

urbach energy

Sayı

Makale detayları

Morphological and optical properties of vacuum evaporated ZnO thin films

Yazarlar: Farzana CHOWDHURY | S. M. Firoz HASAN and M. Sahabul ALAM

Yayıncı: TUBITAK

Dergi: Turkish Journal of Physics 2012 Vol.36 Issue 1, pp.1-7

Belge Tipi: Makale

Yayın Tarihi: 12/2011

Belge Dili: Türkçe

Document ID (Org No.): 2000760457

Sıklık: İki Aylık

eISSN: 1303-6122

pISSN: 1300-0101

ZnO thin film

vacuum evaporation

optical properties

urbach energy

Sayı

Yazarlar:

Farzana CHOWDHURY | S. M. Firoz HASAN and M. Sahabul ALAM

Yayıncı:

TUBITAK

Dergi:

Turkish Journal of Physics 2012 Vol.36 Issue 1, pp.1-7

Belge Tipi:

Makale

Yayın Tarihi:

12/2011

Belge Dili:

Türkçe

Document ID (Org No.):

2000760457

Sıklık:

İki Aylık

eISSN:

1303-6122

pISSN:

1300-0101